By Rik Brydson
The ebook is anxious with the idea, heritage, and functional use of transmission electron microscopes with lens correctors which could right the consequences of round aberration. The ebook additionally covers a comparability with aberration correction within the TEM and purposes of analytical aberration corrected STEM in fabrics technology and biology. This booklet is key for microscopists fascinated about nanoscale and fabrics microanalysis specially these utilizing scanning transmission electron microscopy, and comparable analytical ideas corresponding to electron diffraction x-ray spectrometry (EDXS) and electron power loss spectroscopy (EELS).
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Extra info for Aberration-corrected Analytical Electron Microscopy
And Malac, M. (2004) Radiation damage in the TEM and SEM, Micron 35, 399–409. Goldstein, J. , Sawyer, L. R. (2003) Scanning Electron Microscopy and X-ray Microanalysis, Springer. J. and Beanland, R. (2001) Electron Microscopy and Analysis. Taylor and Francis. W. ) (2008) Advances in Imaging and Electron Physics, Vol. 153, Elsevier. J. (1998) Advanced Computing in Electron Microscopy, Plenum Press, New York. T. (2002) Determination Of Core Structure Periodicity And Point Defect Density Along Dislocations, PhD Thesis, Arizona State University.
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A weak phase object is a specimen so thin that the electron beam passing thorough it only suffers a modest phase shift, while its amplitude remains effectively unchanged. The approximation that a specimen is indeed a weak phase object is important for much of the treatment in Chapter 5. It should be obvious that such a specimen must be substantially thinner than the mean free path for all the inelastic scattering processes. In practice many biological specimens will meet this criterion at thicknesses below 50 nm, but specimens containing substantially heavier atoms would need to be much thinner.
Aberration-corrected Analytical Electron Microscopy by Rik Brydson