Read e-book online Advances in optical and electron microscopy PDF

By Tom Mulvey, Charles J.R. Sheppard

ISBN-10: 0120299127

ISBN-13: 9780120299126

The volumes during this sequence hide the development and innovation in optical and electron microscopy at a primary point. it truly is aimed toward microscopists and researchers not just drawn to microscope instrumentation but additionally in functions starting from organic strategies to fabrics study and business inspection

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In general, the terms ß(R,r) and /(R, r) can also take into account intentional manipulations such as spatial frequency filtering or the employment of a phase plate, as well as the usual aberrations of the objective lens. In the next imaging stage, the image wave b(r) = /l(r)exp(i

The electron hologram is illuminated with a laser light wave and imaged by means of the reconstruction lens; in the back focal plane the Fourier transform of the hologram can be found. Figure 8 shows the zero beam surrounded by the autocorrelation and, on either side, the two sidebands representing the Fourier spectrum of the reconstructed image wave. Screening off" everything but one sideband, a light optical copy of the electron image wave is found in the image plane of the hologram. On the optical bench we are therefore working wave optically in a virtual electron microscope.

In comparison with the light optical technique, the numerical method of reconstruction has four advantages. First, the nonlinearity of the density of the photographic plate as a function of electron exposure can easily be corrected before the reconstruction procedure is started. This measure, especially necessary if a subsequent correction for aberrations is intended, can hardly be performed light-optically. Second, all the proven techniques in light optics for displaying the information in the reconstructed wave can be performed with numerical precision rather than being limited by the restricted accuracy of optical components and the severe problem of their adjustment.

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Advances in optical and electron microscopy by Tom Mulvey, Charles J.R. Sheppard


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