W. Richard Bowen's Atomic Force Microscopy in Process Engineering. Introduction PDF

By W. Richard Bowen

ISBN-10: 1856175170

ISBN-13: 9781856175173

This is the 1st booklet to collect either the elemental conception and confirmed technique engineering perform of AFM. it truly is awarded in a fashion that's obtainable and worthy to training engineers in addition to to people who are enhancing their AFM abilities and data, and to researchers who're constructing new items and options utilizing AFM.

The e-book takes a rigorous and functional process that guarantees it truly is at once appropriate to method engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for technique engineering are basically outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the improvement of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a crucial software for technique engineers and scientists because it permits superior tactics and products
  • The purely e-book facing the idea and sensible functions of atomic strength microscopy in procedure engineering
  • Provides best-practice information and adventure on utilizing AFM for approach and product improvement

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Additional info for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products

Example text

23) where ks is the stiffness of the sample, assuming negligible deformation of the probe. For hard samples or soft cantilevers, keff  kc. 24) Measurements were carried out on a SiO2 surface, freshly cleaved mica and on a silver metal film in air under ambient conditions. Values obtained were of the same magnitude, but not identical, to literature values obtained from Lifshitz theory and measurements with the surface forces apparatus (SFA). One possible reason for this divergence may be the presence of a contaminating water layer present on most surfaces under ambient conditions.

J. A. Ducker, Experimental determination of spring constants in atomic force microscopy, Langmuir 10 (1994) 1003–1004. M. A. Ducker, Lateral, normal and longitudinal spring constants of atomic force microscopy cantilevers, Rev. Sci. Instrum. 65-8 (1994) 2257–2531. E. Sader, Susceptibility of atomic force microscope cantilevers to lateral forces, Rev. Sci. Instrum. 74 (4) (2003) 2438–2443. A. J. M. Pashley, Direct measurement of colloidal forces using an atomic force microscope, Nature 353 (1991) 239–241.

Craig, S. Biggs, Elasto-plastic and visco-elastic deformations of a polymer sphere measured using colloid probe and scanning electron microscopy, Int. J. Adhesion Adhesives 20 (2000) 445–448. R. Castro, M. S. Petri, Adhesion forces between hybrid colloidal particles and concavilin A, Langmuir 22 (2006) 3757–3762. 30 1. Basic Principles of Atomic Force Microscopy [123] N. R. Bowen, Atomic force microscopy study of the rejection of colloids by membrane pores, Desalination 150 (2002) 289–295. R. Bowen, N.

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Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products by W. Richard Bowen

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